2003•Powder MetallurgyRequires access

Transmission electron microscopy sample preparation technique for sintered alloys

William McPhee, David S. McPhail, Richard J. Chater, John Drennan, G. B. Schaffer

Abstract

Powder metallurgy alloys are typically inhomogeneous with a significant amount of porosity. This complicates conventional transmission electron microscopy sample preparation. However, the use of focused ion beam milling allows site specific transmission electron microscopy samples to be prepared in a short amount of time. This paper presents a method that can be used to produce transmission electron microscopy samples from an Al-Cu-Mg PM alloy.

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Available abstract

Key concepts: Transmission electron microscopy, Materials science, Focused ion beam, Alloy, Porosity, Sample preparation, Electron microscope, Powder metallurgy