2016•Advances in intelligent systems and computingRequires access

Study and Analysis of Subthreshold Leakage Current in Sub-65 nm NMOSFET

K. K. Senthil Kumar, Pratyush Dwivedi, Aminul Islam

Open publisher page 0 citations

Abstract

This record does not include an abstract. Use the full-text link above if available.

About this research paper

What this paper is about

An abstract is not available in the OpenAlex record for this paper.

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Key concepts: Subthreshold conduction, Leakage (economics), Materials science, Power consumption, Optoelectronics, Leakage power, Drain-induced barrier lowering, Subthreshold slope

Back to paper search Browse research topics Original source

Study and Analysis of Subthreshold Leakage Current in Sub-65 nm NMOSFET — Research Paper | ScholarLens