Global variability of UTBB MOSFET in subthreshold
S. Makovejev, Babak Kazemi Esfeh, F. Andrieu, Jean‐Pierre Raskin, Denis Flandre, Valeriya Kilchytska
Abstract
S. Makovejev, Babak Kazemi Esfeh, F. Andrieu, Jean‐Pierre Raskin, Denis Flandre, Valeriya Kilchytska
Abstract
Global variability of UTBB MOSFETs in subthresh-old and off regimes is analyzed. Variability of the off-state drain current, subthreshold slope, DIBL, gate leakage current, threshold voltage and their correlations are considered. It is demonstrated that subthreshold drain current variability is not only dependent on the threshold voltage variability, but the effective body factor (incorporating short-channel effects) must also be taken into account.
OpenAlex reports 1 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Global variability of UTBB MOSFETs in subthresh-old and off regimes is analyzed. Variability of the off-state drain current, subthreshold slope, DIBL, gate leakage current, threshold voltage and their correlations are considered. It is demonstrated that subthreshold drain current variability is not only dependent on the threshold voltage variability, but the effective body factor (incorporating short-channel effects) must also be taken into account.
Key concepts: Subthreshold conduction, Drain-induced barrier lowering, Subthreshold slope, Threshold voltage, MOSFET, Current (fluid), Voltage, Logic gate