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2015•Baosteel TechnologyRequires access

Application of electron probe microanalysis in Baosteel

Yin Hu

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Abstract

Electron probe microanalysis( EPMA) puts highly focused electron beam on the sample that makes characteristic X-ray excited from a spot zone of sample. Through measuring wavelength and intensity of the X-ray,No. 5- No. 92 element quality and quantity analysis can be made. EPMA is powerful instrument to research microstructure because it can get sub-microstructure and element map simultaneously to analyse nonuniformity of material. Baosteel have used EPMA for more than 30 years. EPMA play a very important role in research and production,and some instances are given.

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What this paper is about

Electron probe microanalysis( EPMA) puts highly focused electron beam on the sample that makes characteristic X-ray excited from a spot zone of sample. Through measuring wavelength and intensity of the X-ray,No. 5- No. 92 element quality and quantity analysis can be made. EPMA is powerful instrument to research microstructure because it can get sub-microstructure and element map simultaneously to analyse nonuniformity of material. Baosteel have used EPMA for more than 30 years. EPMA play a very important role in research and production,and some instances are given.

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Available abstract

Electron probe microanalysis( EPMA) puts highly focused electron beam on the sample that makes characteristic X-ray excited from a spot zone of sample. Through measuring wavelength and intensity of the X-ray,No. 5- No. 92 element quality and quantity analysis can be made. EPMA is powerful instrument to research microstructure because it can get sub-microstructure and element map simultaneously to analyse nonuniformity of material. Baosteel have used EPMA for more than 30 years. EPMA play a very important role in research and production,and some instances are given.

Key concepts: Electron microprobe, Electron probe microanalysis, Microanalysis, Microstructure, Analytical Chemistry (journal), Cathode ray, Sample (material), Electron

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