[A method of precise adjustment and calibration for high-resolution echelle spectrograph].
Shaojie Chen, Jicheng Cui, Yujuan Liu, Bayanheshig Bayanheshig, Yuguo Tang
Abstract
Shaojie Chen, Jicheng Cui, Yujuan Liu, Bayanheshig Bayanheshig, Yuguo Tang
Abstract
Echelle spectrograph is a new type of high-resolution, high-precise spectrograph, and its resolution can be up to tens of thousands to hundreds of thousands. In this case, a little error of the structure will affect the resolution and precision greatly, so an accurate adjustment is of importance for the echelle spectrograph. According to the design features, the present paper discusses the adjustment method for echelle spectrograph. This is an uncomplicated, quick method, and adapts to mini, airproof structure of echelle spectrograph. Using this method, the actual state is consistent with the design result. The result of wavelength calibration is given out, and the error is less than 0.002 nm, which satisfies the requirement of the system.
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Echelle spectrograph is a new type of high-resolution, high-precise spectrograph, and its resolution can be up to tens of thousands to hundreds of thousands. In this case, a little error of the structure will affect the resolution and precision greatly, so an accurate adjustment is of importance for the echelle spectrograph. According to the design features, the present paper discusses the adjustment method for echelle spectrograph. This is an uncomplicated, quick method, and adapts to mini, airproof structure of echelle spectrograph. Using this method, the actual state is consistent with the design result. The result of wavelength calibration is given out, and the error is less than 0.002 nm, which satisfies the requirement of the system.
Key concepts: Spectrograph, Calibration, Optics, Resolution (logic), Wavelength, Spectral resolution, Physics, High resolution