Wan Yu
Abstract
In this paper, the dynamic modeling method is used to analyze the reliability growth of missile weapon system. Based on the linear statistical method, by the failure rate of different growth periods, a reliability growth model is presented. It can well describe the practical condition of the running system.
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
In this paper, the dynamic modeling method is used to analyze the reliability growth of missile weapon system. Based on the linear statistical method, by the failure rate of different growth periods, a reliability growth model is presented. It can well describe the practical condition of the running system.
Key concepts: Missile, Weapon system, Reliability (semiconductor), Reliability engineering, Engineering, Failure rate, Statistical analysis, Growth model