ScholarLens Back to search
2005•Journal of Hubei Polytechnic UniversityRequires access

A Contact and Non-contact Synthesis Measuring Profilometer

Tiebang Xie

Open publisher page 0 citations

Abstract

The principle, structure and experiment results of a synthesis measuring profilometer are presented. The system can select contact or non-contact measuring method. It is suitable for a wider range of applications compared with surface topography measuring instruments with only one measuring mode. The maximum vertical measuring range by the contact method can reach 3 mm with a minimum resolution of 0.005 μm and the range by the non-contact method can reach 500 μm with a minimum resolution of 0.01 μm.

About this research paper

What this paper is about

The principle, structure and experiment results of a synthesis measuring profilometer are presented. The system can select contact or non-contact measuring method. It is suitable for a wider range of applications compared with surface topography measuring instruments with only one measuring mode. The maximum vertical measuring range by the contact method can reach 3 mm with a minimum resolution of 0.005 μm and the range by the non-contact method can reach 500 μm with a minimum resolution of 0.01 μm.

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

The principle, structure and experiment results of a synthesis measuring profilometer are presented. The system can select contact or non-contact measuring method. It is suitable for a wider range of applications compared with surface topography measuring instruments with only one measuring mode. The maximum vertical measuring range by the contact method can reach 3 mm with a minimum resolution of 0.005 μm and the range by the non-contact method can reach 500 μm with a minimum resolution of 0.01 μm.

Key concepts: Profilometer, Range (aeronautics), Optics, Resolution (logic), Materials science, Computer science, Physics, Surface finish

Related papers

Related paper 1Related paper 2Related paper 3
Back to paper searchBrowse research topicsOriginal source
A Contact and Non-contact Synthesis Measuring Profilometer — Research Paper | ScholarLens