2005Dianzi Ke-ji Daxue xuebaoRequires access

Fault Diagnosis of the Digital Logic Circuit Bast on Boolean Difference Calculus

Feng Lu

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Abstract

The applying of the large scale and super large scale integrate circuit in electronic systems gradually abroad. The research to the fault diagnosis design for testability of the digital system draws the technologist's fully attention. Multi-fault formula were given in this paper . The paper stresses the fault diagnosis and test set and design for testability by Boolean algebra method .

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What this paper is about

The applying of the large scale and super large scale integrate circuit in electronic systems gradually abroad. The research to the fault diagnosis design for testability of the digital system draws the technologist's fully attention. Multi-fault formula were given in this paper . The paper stresses the fault diagnosis and test set and design for testability by Boolean algebra method .

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Available abstract

The applying of the large scale and super large scale integrate circuit in electronic systems gradually abroad. The research to the fault diagnosis design for testability of the digital system draws the technologist's fully attention. Multi-fault formula were given in this paper . The paper stresses the fault diagnosis and test set and design for testability by Boolean algebra method .

Key concepts: Testability, Digital electronics, Boolean algebra, Fault (geology), Computer science, Boolean circuit, Set (abstract data type), Scale (ratio)

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