Multiple fault diagnosis with BDD based boolean differential equations
Raimund Ubar, Jaan Raik, Sergei Kostin, Jaak Kõusaar
Abstract
Raimund Ubar, Jaan Raik, Sergei Kostin, Jaak Kõusaar
Abstract
We present a new idea for multiple fault diagnosis in combinational circuits, which combines the concept of multiple fault testing by test groups and solving Boolean differential equations by manipulation of Binary Decision Diagrams (BDDs). A novel 5-valued algebra is introduced for simplifying differential equations, and a discussion is presented how this approach can be used as a basis for hierarchical fault diagnosis to cope with the complexity problem.
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We present a new idea for multiple fault diagnosis in combinational circuits, which combines the concept of multiple fault testing by test groups and solving Boolean differential equations by manipulation of Binary Decision Diagrams (BDDs). A novel 5-valued algebra is introduced for simplifying differential equations, and a discussion is presented how this approach can be used as a basis for hierarchical fault diagnosis to cope with the complexity problem.
Key concepts: Binary decision diagram, Boolean function, Boolean algebra, Combinational logic, Computer science, Fault (geology), Binary number, Boolean circuit