2008Microcomputer InformationRequires access

A DC-Model for Simulation of NMOS ESD Protection Device

Yang Dian-xion

Open publisher page 0 citations

Abstract

A practical DC model for simulation of ESD NMOS is presented. Models for MOS transistor based on BSIM 3V3, bipolar transistor for parasitic effect, substrate resistance and series resistance are provided. Studies have been done on the snapback and parasitic bipolar action for modeling ESD NMOS. Equations for modeling the high current behavior of NMOS transistor have been developed. Extraction methodology for obtaining the bipolar parameters is given. Simulation results are presented and compared to the experiment data.

About this research paper

What this paper is about

A practical DC model for simulation of ESD NMOS is presented. Models for MOS transistor based on BSIM 3V3, bipolar transistor for parasitic effect, substrate resistance and series resistance are provided. Studies have been done on the snapback and parasitic bipolar action for modeling ESD NMOS. Equations for modeling the high current behavior of NMOS transistor have been developed. Extraction methodology for obtaining the bipolar parameters is given. Simulation results are presented and compared to the experiment data.

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

A practical DC model for simulation of ESD NMOS is presented. Models for MOS transistor based on BSIM 3V3, bipolar transistor for parasitic effect, substrate resistance and series resistance are provided. Studies have been done on the snapback and parasitic bipolar action for modeling ESD NMOS. Equations for modeling the high current behavior of NMOS transistor have been developed. Extraction methodology for obtaining the bipolar parameters is given. Simulation results are presented and compared to the experiment data.

Key concepts: NMOS logic, Snapback, Electrostatic discharge, Computer science, Transistor, Bipolar junction transistor, Electrical engineering, Electronic engineering

Related papers

Back to paper searchBrowse research topicsOriginal source
A DC-Model for Simulation of NMOS ESD Protection Device — Research Paper | ScholarLens