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The Capacitance Measuring Circuit for Electrical Capacitance Tomography System

Lin Han

Open publisher page 1 citations

Abstract

The technology of electrical capacitance tomography is the main trend, and in this system the measurement of low value capacitance is one of the keys and the difficult problems. In view of electrical capacitance tomography system, a measurement circuit for electrical capacitance tomography system is presented. Static error is less than 0.2% for capacitance measurement, and drift is 0.05% per hour. Our experiment results show the circuit is satisfying.

About this research paper

What this paper is about

The technology of electrical capacitance tomography is the main trend, and in this system the measurement of low value capacitance is one of the keys and the difficult problems. In view of electrical capacitance tomography system, a measurement circuit for electrical capacitance tomography system is presented. Static error is less than 0.2% for capacitance measurement, and drift is 0.05% per hour. Our experiment results show the circuit is satisfying.

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OpenAlex reports 1 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

The technology of electrical capacitance tomography is the main trend, and in this system the measurement of low value capacitance is one of the keys and the difficult problems. In view of electrical capacitance tomography system, a measurement circuit for electrical capacitance tomography system is presented. Static error is less than 0.2% for capacitance measurement, and drift is 0.05% per hour. Our experiment results show the circuit is satisfying.

Key concepts: Electrical capacitance tomography, Capacitance, Differential capacitance, Tomography, Capacitance probe, Parasitic capacitance, Materials science, Electrical engineering

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