Measurement of the thickness and refractive index of thin transparency
Bin Zhao
Abstract
Bin Zhao
Abstract
A method of measuring the thickness and refractive index of thin transparency is introduced.
OpenAlex reports 1 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
A method of measuring the thickness and refractive index of thin transparency is introduced.
Key concepts: Physics, Refractive index, Transparency (behavior), Optics, Index (typography), Law, World Wide Web, Political science