1998•Unpublished venueRequires access

New interference method for measuring the thickness and refractive index of thin films

L. A. Gerasimova

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Key concepts: Refractive index, Materials science, Interference (communication), Optics, Thin film, Index (typography), Optoelectronics, Computer science

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New interference method for measuring the thickness and refractive index of thin films — Research Paper | ScholarLens