2008Journal of Yunyang Teachers CollegeRequires access

Refractive Index and Thickness of Michelson Interferometer Measure Film

LU Su-yan

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Abstract

This paper has introduced the easy and simple method to determine film refractive index and thickness by Michelson interferometer.The film thickness of high precision can be determined by determining the motion quantity of moving mirror and observing the relevant interference fringe,on which actual determination has been carried out,whose theory and practice conform to each other.

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What this paper is about

This paper has introduced the easy and simple method to determine film refractive index and thickness by Michelson interferometer.The film thickness of high precision can be determined by determining the motion quantity of moving mirror and observing the relevant interference fringe,on which actual determination has been carried out,whose theory and practice conform to each other.

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Available abstract

This paper has introduced the easy and simple method to determine film refractive index and thickness by Michelson interferometer.The film thickness of high precision can be determined by determining the motion quantity of moving mirror and observing the relevant interference fringe,on which actual determination has been carried out,whose theory and practice conform to each other.

Key concepts: Michelson interferometer, Optics, Interference (communication), Measure (data warehouse), Interferometry, Refractive index, Materials science, Index (typography)

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