Dependent Failure Numerical Analysis Method For Weibull Distributed Units
Yan Hong
Abstract
Yan Hong
Abstract
Dependent failure of parallel system rapidly decreases its reliability, which is required consideration in engineering. Exponential distribution, normal distribution and lognormal distribution are approximately expressed by Weibull distribution, which is easily discussed by calculation analysis. Based on the cumulative failure probability equality principle, a dependent failure numerical method of Weibull distributed units is presented. The proposed method that discussed in details can be used in dependent failure analysis, reliability analysis and analysis of the mean time to failure of Weibull distributed units. The method also can be used in other distribution if the distribution is approximately expressed by Weibull distribution.
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Dependent failure of parallel system rapidly decreases its reliability, which is required consideration in engineering. Exponential distribution, normal distribution and lognormal distribution are approximately expressed by Weibull distribution, which is easily discussed by calculation analysis. Based on the cumulative failure probability equality principle, a dependent failure numerical method of Weibull distributed units is presented. The proposed method that discussed in details can be used in dependent failure analysis, reliability analysis and analysis of the mean time to failure of Weibull distributed units. The method also can be used in other distribution if the distribution is approximately expressed by Weibull distribution.
Key concepts: Weibull distribution, Log-normal distribution, Exponential distribution, Distribution fitting, Weibull modulus, Exponentiated Weibull distribution, Reliability (semiconductor), Reliability engineering