A Reliability Data Analysis Method Using Mixture Weibull Distribution Model
Ying Kui Gu, De Liang Ge, Yao Gang Xiong
Abstract
Ying Kui Gu, De Liang Ge, Yao Gang Xiong
Abstract
The weibull distribution plays a crucial role in reliability theory and life-testing experiments. Weibull mixtures are widely used to model lifetime and failure time data, since they exhibit a wide range of shapes for the failure rate function. In this paper, the failure data of crank rod system was analyzed by using mixture weibull distribution model. The distribution parameters of the mixture weibull distribution model were estimated by using maximum likelihood estimation and drawing method. The comparison of fitting degree of failure location between standard weibull distribution model and mixture weibull model was given. Results show that the fitting degree of the failure data in the mixture weibull distribution model is higher than that of the simple weibull distribution model, and it can more accurately described the failure distribution curve of the system in life cycle.
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The weibull distribution plays a crucial role in reliability theory and life-testing experiments. Weibull mixtures are widely used to model lifetime and failure time data, since they exhibit a wide range of shapes for the failure rate function. In this paper, the failure data of crank rod system was analyzed by using mixture weibull distribution model. The distribution parameters of the mixture weibull distribution model were estimated by using maximum likelihood estimation and drawing method. The comparison of fitting degree of failure location between standard weibull distribution model and mixture weibull model was given. Results show that the fitting degree of the failure data in the mixture weibull distribution model is higher than that of the simple weibull distribution model, and it can more accurately described the failure distribution curve of the system in life cycle.
Key concepts: Weibull distribution, Weibull modulus, Reliability (semiconductor), Statistics, Range (aeronautics), Weibull fading, Distribution fitting, Shape parameter