Relation between Characters of the Top-three Leaves and Yield and Its Compositions of Wheat
Yan Su-hong
Abstract
Yan Su-hong
Abstract
Fifteen genotypes of high-yield wheat were studied as materials. This experiment indicated that the flag leaf was an important part in all over the life in wheat. There was a significant relationship between the width of the top three leaves and grain weight per plant, the grain weight per plant increased much greater with the width increasing of flag leaf than with that of other traits, and grain weight per plant increased in wider range. Increasing one cm width of flag leaf, the grain weight per plant could increase 7.7284 g, and the area of the second leaf was less importance to grain weight per plant.
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Fifteen genotypes of high-yield wheat were studied as materials. This experiment indicated that the flag leaf was an important part in all over the life in wheat. There was a significant relationship between the width of the top three leaves and grain weight per plant, the grain weight per plant increased much greater with the width increasing of flag leaf than with that of other traits, and grain weight per plant increased in wider range. Increasing one cm width of flag leaf, the grain weight per plant could increase 7.7284 g, and the area of the second leaf was less importance to grain weight per plant.
Key concepts: Grain yield, Agronomy, Flag (linear algebra), Yield (engineering), Biology, Horticulture, Mathematics, Materials science