2009Sci-Tech Information Development & EconomyRequires access

The Design of Patent Citation Database Based on Patent Measuring

Guo‐Qin Zhang

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Abstract

This paper expounds the concepts of patent measuring and patent citation analysis, advances the idea of establishing the patent citation database, and based on the function of statistical analysis, introduces some statistic indexes such as the technology developing index, impact factor, and citation rate, etc., which can provide the reference for evaluating the patent value and RD level of regions, organizations and even individuals.

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What this paper is about

This paper expounds the concepts of patent measuring and patent citation analysis, advances the idea of establishing the patent citation database, and based on the function of statistical analysis, introduces some statistic indexes such as the technology developing index, impact factor, and citation rate, etc., which can provide the reference for evaluating the patent value and RD level of regions, organizations and even individuals.

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Available abstract

This paper expounds the concepts of patent measuring and patent citation analysis, advances the idea of establishing the patent citation database, and based on the function of statistical analysis, introduces some statistic indexes such as the technology developing index, impact factor, and citation rate, etc., which can provide the reference for evaluating the patent value and RD level of regions, organizations and even individuals.

Key concepts: Statistic, Patent visualisation, Citation, Computer science, Index (typography), Function (biology), Value (mathematics), Data science

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