2014Unpublished venueRequires access

Information fusion based on equipment reliability prediction

Mingfei Xia, Xudong Zhan, Mingqi Xia, Juntao Ma

Open publisher page 1 citations

Abstract

Traditional reliability assessment methods are generally on the basis of failure lifetime data. The failure lifetime data of high reliability and long lifetime product are obtained difficultly by life test and accelerated life test. Degradation data can provide useful information about the reliability assessment for these products. Aiming at these problems, a method of reliability prediction is presented based on failure data's reliability assessment, accelerated performance degradation and information fusion theory. Finally, this paper gives a case of accelerated performance degradation testing of 24V/2A power supply board to steady voltage to apply the method, whose results demonstrate that this method is correct and valid for reliability assessment of high reliability and long life electronic equipments.

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What this paper is about

Traditional reliability assessment methods are generally on the basis of failure lifetime data. The failure lifetime data of high reliability and long lifetime product are obtained difficultly by life test and accelerated life test. Degradation data can provide useful information about the reliability assessment for these products. Aiming at these problems, a method of reliability prediction is presented based on failure data's reliability assessment, accelerated performance degradation and information fusion theory. Finally, this paper gives a case of accelerated performance degradation testing of 24V/2A power supply board to steady voltage to apply the method, whose results demonstrate that this method is correct and valid for reliability assessment of high reliability and long life electronic equipments.

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Available abstract

Traditional reliability assessment methods are generally on the basis of failure lifetime data. The failure lifetime data of high reliability and long lifetime product are obtained difficultly by life test and accelerated life test. Degradation data can provide useful information about the reliability assessment for these products. Aiming at these problems, a method of reliability prediction is presented based on failure data's reliability assessment, accelerated performance degradation and information fusion theory. Finally, this paper gives a case of accelerated performance degradation testing of 24V/2A power supply board to steady voltage to apply the method, whose results demonstrate that this method is correct and valid for reliability assessment of high reliability and long life electronic equipments.

Key concepts: Reliability engineering, Reliability (semiconductor), Computer science, Accelerated life testing, Degradation (telecommunications), Reliability theory, Information fusion, Power (physics)

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