Comparison of two kind of flat panel detector radiography system:imaging quality versus exposure dose

ObjectiveTo compare the imaging quality at different exposure settings for amorphous Silicon (a:Si) Cesium Iodide (CsI) flat panel detector digital radiography system with amorphous Selenium (a:Se) flat panel detector digital radiography system. Methods The images of contrast-detail phantom (CDRAD 2.0) were taken at different exposure settings for two digital radiography systems. Four independent observers read the images and calculated the IQF for different dose settings. The detectability of two system for contrast and detail was analysed using ANOVA. A ROC analysis was performed with TRG phantom in different exposure settings. The statistical significance was evaluated using the Wilcoxon test. Results There was a significant difference of IQF and Az values of ROC between the two systems at lower dose exposure, which ensured a better image quality concerning contrast and detail detectability. Higher dose exposure provided similar results for both systems. ConclusionThe a:Si flat panel digital radiography system proved to be superior to a:Se flat panel digital radiography system at low dose settings. Without the image quality lost, the patient dose might be reduced if an a:Si system was used.