Fang Xiang
Abstract
In this paper we introduced some fashion BIST pattern for the problems of SOC.We analysed their excellence and disadvantage,discussed them and finally we Expected the future of SOC BIST.
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In this paper we introduced some fashion BIST pattern for the problems of SOC.We analysed their excellence and disadvantage,discussed them and finally we Expected the future of SOC BIST.
Key concepts: Computer science, Reliability engineering, Computer architecture, Engineering