2016•Bulletin of the American Physical SocietyRequires access

Nanoscopic oxidation of p-type and un-doped Si (100) surfaces using un-externally biased atomic force microscope tips (AFM) in the presence of selected organic solvents

Jeffrey A. McCausland, Sajeevi S. Withanage, Robert Mallik, Sergei F. Lyuksyutov

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Key concepts: Atomic force microscopy, Nanoscopic scale, Doping, Materials science, Nanotechnology, Chemical engineering, Analytical Chemistry (journal), Chemistry

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Nanoscopic oxidation of p-type and un-doped Si (100) surfaces using un-externally biased atomic force microscope tips (AFM) in the presence of selected organic solvents — Research Paper | ScholarLens