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2014•Microscopy and MicroanalysisOpen access

Three-Dimensional Imaging of Dislocations and Defects in Materials at Atomic Resolution Using Electron Tomography

Jianwei Miao, Chien-Chun Chen, Mary Cooper Scott, Peter A. Ercius, Chun Zhu, Matthew H. Mecklenburg, Edward R. White, Chin‐Yi Chiu, B. C. Regan, Yu Huang, Laurence D. Marks, Ulrich Dahmen

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Abstract

Jianwei Miao, Chien-Chun Chen, M C Scott, Peter Ercius, Chun Zhu, Matthew Mecklenburg, Edward R White, Chin-Yi Chiu, B C Regan, Yu Huang, Laurence D Marks,

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What this paper is about

Jianwei Miao, Chien-Chun Chen, M C Scott, Peter Ercius, Chun Zhu, Matthew Mecklenburg, Edward R White, Chin-Yi Chiu, B C Regan, Yu Huang, Laurence D Marks,

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Available abstract

Jianwei Miao, Chien-Chun Chen, M C Scott, Peter Ercius, Chun Zhu, Matthew Mecklenburg, Edward R White, Chin-Yi Chiu, B C Regan, Yu Huang, Laurence D Marks,

Key concepts: Materials science, Electron tomography, Electron, Tomography, Resolution (logic), Optics, Physics, Nanotechnology

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