2014•Transactions of Nonferrous Metals Society of ChinaRequires access

Development of advanced electron tomography in materials science based on TEM and STEM

Maohua Li, Yanqing Yang, Bing Huang, Xian Luo, Wei Zhang, Ming Han, Jigang Ru

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Key concepts: Electron tomography, Tomography, Scanning transmission electron microscopy, Dark field microscopy, Materials science, Optics, Tilt (camera), Transmission electron microscopy

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Development of advanced electron tomography in materials science based on TEM and STEM — Research Paper | ScholarLens