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A methodology for the fabrication by FIB of needle-shape specimens around sub-surface features at the nanometre scale

Jesús Hernández‐Saz, Miriam Herrera, Sergio Ignacio Molina

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Key concepts: Fabrication, Focused ion beam, Materials science, Nanometre, Transmission electron microscopy, Nanotechnology, Secondary electrons, Quantum dot

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A methodology for the fabrication by FIB of needle-shape specimens around sub-surface features at the nanometre scale — Research Paper | ScholarLens