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Investigation of Tibetian Plateau varnish: new findings at the nanoscale using focused ion beam and transmission electron microscopy techniques

Kurt A. Langworthy, David Krinsley, Ronald I. Dorn

Abstract

Dual-beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high-resolution transmission electron microscopy (HR-TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techniques could provide a method for studying ancient terrestrial and extra-terrestrial environments to better understand geological processes at the nanoscale.

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Available abstract

Key concepts: Focused ion beam, Nanoscopic scale, Transmission electron microscopy, Materials science, Nanostructure, Varnish, Ion beam, Microscopy