Calibration of Characteristic Parameters for Xray Plane Crystal on the Automatic Xray Diffractometer

X-ray crystal characteristic parameters are the bases of identification of X-ray crystal species and class,kinds of X-ray crystal spectrometer fabrication,X-ray lines intensity quantitative measurement and X-ray monochromatic image diagnosis.On the automatic X-ray diffractometer(XRD),based on stability and precision control of θ and 2θ goniometer,special plane crystal holder was made.Bremsstrahlung and Cu-Kα line were attenuated for 5 orders by 40 μm-thick Nickel filter,X-ray sources was to be Cu-Kα monochromatic source,and transmission power of filter was the criterion of Cu-Kα monochromatic source.For X-ray Pentaerythritol(002) plane crystal of Crystal lattice(2d) and integral reflective coefficient(Rc) of Cu-Kα energy were calibrated,there are 2d=(0.87 425±0.00 042)nm,Rc=(1.759±0.024)×10-4 Rad respectively.This kind of experimental method is efficient and convenient on XRD in common laboratory.On XRD,other monochromatic X-ray sources can be obtained by changing the material of X-ray tube,and integral reflective coefficient of different energy will be obtained by the same way.