2019•Integrated ferroelectricsRequires access

Ultraviolet light effect on characteristics of PbZr x Ti 1-x O 3 (PZT) film during poling process

Chin‐Chi Cheng

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Abstract

Poling process is one of the widely used strategies to enhance the film properties during the manufacturing processes of ceramic film. A lab-made PbZr x Ti 1-x O 3 (PZT) film by spin-coating on Ti substrate is presented. After heating treatments, the fabricated film was passed corona poling under ultraviolent (UV) light of various power. The characteristics of the PZT film have been evaluated by several instruments, such as X-ray diffractometer (XRD), scanning electron microscopy (SEM) and impedance analyzer. The results indicated that UV light would affect the orientation of crystallization, microstructure and grain size of PZT film surface during poling process under room temperature.

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What this paper is about

Poling process is one of the widely used strategies to enhance the film properties during the manufacturing processes of ceramic film. A lab-made PbZr x Ti 1-x O 3 (PZT) film by spin-coating on Ti substrate is presented. After heating treatments, the fabricated film was passed corona poling under ultraviolent (UV) light of various power. The characteristics of the PZT film have been evaluated by several instruments, such as X-ray diffractometer (XRD), scanning electron microscopy (SEM) and impedance analyzer. The results indicated that UV light would affect the orientation of crystallization, microstructure and grain size of PZT film surface during poling process under room temperature.

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Available abstract

Poling process is one of the widely used strategies to enhance the film properties during the manufacturing processes of ceramic film. A lab-made PbZr x Ti 1-x O 3 (PZT) film by spin-coating on Ti substrate is presented. After heating treatments, the fabricated film was passed corona poling under ultraviolent (UV) light of various power. The characteristics of the PZT film have been evaluated by several instruments, such as X-ray diffractometer (XRD), scanning electron microscopy (SEM) and impedance analyzer. The results indicated that UV light would affect the orientation of crystallization, microstructure and grain size of PZT film surface during poling process under room temperature.

Key concepts: Materials science, Diffractometer, Poling, Scanning electron microscope, Microstructure, Spin coating, Ceramic, Crystallization

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