Threshold Logic With Electrostatically Formed Nanowires
Joseph S. Friedman, Andrey Godkin, Alex Henning, Yonatan Vaknin, Y. Rosenwaks, Alan V. Sahakian
Abstract
Joseph S. Friedman, Andrey Godkin, Alex Henning, Yonatan Vaknin, Y. Rosenwaks, Alan V. Sahakian
Abstract
The modulation of current through an electrostatically formed nanowire (EFN) is controlled by the voltage on the four input gates. The behavior of this multi-gate transistor can be interpreted as a complex four-input switching process, enabling the computation of multiple-input threshold logic functions using a single device. We have therefore created a novel threshold logic family leveraging these unique capabilities that enables the efficient computation of complex logic functions. Experimental and simulation data are provided to demonstrate feasibility and evaluate behavior. This logic family overcomes the challenge posed by the input-output voltage mismatch inherent to EFNs and produces circuits with one-eighth the number of active logic devices and one-quarter the number of transistors required by CMOS.
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The modulation of current through an electrostatically formed nanowire (EFN) is controlled by the voltage on the four input gates. The behavior of this multi-gate transistor can be interpreted as a complex four-input switching process, enabling the computation of multiple-input threshold logic functions using a single device. We have therefore created a novel threshold logic family leveraging these unique capabilities that enables the efficient computation of complex logic functions. Experimental and simulation data are provided to demonstrate feasibility and evaluate behavior. This logic family overcomes the challenge posed by the input-output voltage mismatch inherent to EFNs and produces circuits with one-eighth the number of active logic devices and one-quarter the number of transistors required by CMOS.
Key concepts: Pass transistor logic, Logic gate, AND-OR-Invert, Logic family, Computation, CMOS, Electronic engineering, Transistor