638 Development of focused-ion-beam (FIB) machining systems for fabricating 3-D micro- and nano- structures
Sang‐Jae Kim, Tsutomu Yamashita, Koji Iwasaki
Abstract
Open-access reader
Sang‐Jae Kim, Tsutomu Yamashita, Koji Iwasaki
Abstract
Open-access reader
We designed an FIB micro-machining system for making 3-D micro- and nano- structures. The system used an automatic sample stage tilting up to 93° for machining a pattern of bridge width from the top direction and the bridge height from the lateral direction by tilting the sample stage. The exact size of structures was etched by scanning the sample images from the top and lateral view. These etching methods using first in-situ FIB micro-machining system used in this system also showed many advantages for fabricating 3-D structure including tunneling devices.
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
We designed an FIB micro-machining system for making 3-D micro- and nano- structures. The system used an automatic sample stage tilting up to 93° for machining a pattern of bridge width from the top direction and the bridge height from the lateral direction by tilting the sample stage. The exact size of structures was etched by scanning the sample images from the top and lateral view. These etching methods using first in-situ FIB micro-machining system used in this system also showed many advantages for fabricating 3-D structure including tunneling devices.
Key concepts: Machining, Focused ion beam, Nano-, Materials science, Etching (microfabrication), Bridge (graph theory), Sample (material), Ion beam