ScholarLens Back to search
2003•한국진공학회 학술발표회초록집Requires access

IMeasurement of ion - induced secondary electron emission coefficient for MgO thin film with O₂plasma treatme

Jiyoon Jeong, H. S. Jeong, Jaechul Lim, W. B. Park, J. W. Cho, Eun Ha Choi

Open publisher page 0 citations

Abstract

This record does not include an abstract. Use the full-text link above if available.

About this research paper

What this paper is about

An abstract is not available in the OpenAlex record for this paper.

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Key concepts: Ion, Plasma, Materials science, Secondary emission, Electron, Atomic physics, Chemistry, Physics

Related papers

Related paper 1Related paper 2Related paper 3
Back to paper searchBrowse research topicsOriginal source
IMeasurement of ion - induced secondary electron emission coefficient for MgO thin film with O₂plasma treatme — Research Paper | ScholarLens