Fabrication and Characterization of Cd0.4Sn0.6Te Thin Films Grown by Hot Wall Evaporation

The cadmium tin telluride compound was prepared by direct reac- tion of its high purity elemental constituents using rotating furnace. Thin films were fabricated on glass substrates by hot wall vacuum evaporation technique. The X-ray diffraction studies revealed that all the films are face centered cubic structure. The EDAX studies showed the composition as Cd0.4Sn0.6Te. The UV-Vis-NIR optical transmittance spectrum of thin films of different thickness and different substrate temperatures were obtained and it was found that the op- tical band gap decreases with increase in substrate temperature and thickness of films.