Characterization of Cadmium Tin Oxide Thin Films as a Window Layer for Solar Cell

Cadmium tin oxide thin (Cd2SnO4 ) films prepared by thermal evaporation technique at room temperature. The film deposited with thicknesses of 400 nm, then annealed at different annealing temperatures (350, 400, and 450 K). X-ray diffraction analysis of thin Cd2SnO4 films showed cubic polycrystalline structure. The surface morphological was investigated by atomic force microscopy (AFM), which revealed the crystalline nature of the films. The optical parameters of the prepared films as transmittance, optical energy gab, refractive index, extinction coefficient and the dielectric constants were found to be affected by varying the annealing temperatures