Atomic-level engineering of phase change material for novel fast-switching and high-endurance PCM for storage class memory application
Huai‐Yu Cheng, Matthew J. BrightSky, Simone Raoux, C. F. Chen, Pei-Ying Penny Du, J.Y. Wu, Yu‐Yu Lin, T. H. Hsu, Yu Zhu, Sang‐Bum Kim, C. M. Lin, Ayan Ray, H.L. Lung, C. Lam
Abstract