High frequency properties of shielded power cable. Part 2: sources of error in measuring shield dielectric properties
Chunchuan Xu, S.A. Boggs
Abstract
Chunchuan Xu, S.A. Boggs
Abstract
This paper provides a theoretical context for the types of errors that are likely to occur during the measurement of high frequency cable shield properties. The paper considers a RC dielectric system as it relates to measuring the dielectric properties of cable shield materials.
OpenAlex reports 19 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
This paper provides a theoretical context for the types of errors that are likely to occur during the measurement of high frequency cable shield properties. The paper considers a RC dielectric system as it relates to measuring the dielectric properties of cable shield materials.
Key concepts: Shielded cable, Shield, Power cable, Dielectric, Materials science, Context (archaeology), Electromagnetic shielding, Power (physics)