Low temperature characterization of ceramic and film power capacitors

Among the key requirements for advanced electronic systems is the ability to withstand harsh environments while maintaining reliable and efficient operation. Efforts were taken to design and develop power capacitors capable of wide temperature operation. Ceramic and film power capacitors were developed and characterized as a function of temperature from 20/spl deg/C to -185/spl deg/C in terms of their dielectric properties. These properties included capacitance stability and dielectric loss in the frequency range of 50 Hz to 100 kHz. DC leakage current measurements were also performed on the capacitors. The paper presents the results that indicate good operational characteristic behavior and stability of the components tested at low temperatures.