2002•Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and AtomsRequires access

Ion beam analysis of ion-assisted deposited amorphous GaN

J. Kennedy, A. Markwitz, U. D. Lanke, A. McIvor, H. J. Trodahl, A. Bittar

Open publisher page 29 citations

Abstract

This record does not include an abstract. Use the full-text link above if available.

About this research paper

What this paper is about

An abstract is not available in the OpenAlex record for this paper.

Why it matters

OpenAlex reports 29 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Key concepts: Elastic recoil detection, Ion beam analysis, Materials science, Rutherford backscattering spectrometry, Amorphous solid, Analytical Chemistry (journal), Nuclear reaction analysis, Ion beam

Back to paper search Browse research topics Original source

Ion beam analysis of ion-assisted deposited amorphous GaN — Research Paper | ScholarLens