A mixed-signal built-in self-test approach for analog circuits

A built-in self-test (BIST) approach is described which is designed to test the analog portion of mixed-signal integrated circuits and systems. The BIST circuitry is located in the digital portion of the mixed-signal circuitry to minimize area overhead and effects on the analog portion of the mixed-signal system. The approach was evaluated using benchmark circuits for analog testing and found to consistently provide fault coverage greater than 95%, even when acceptable component parameter variations are added to the set of benchmark circuits.