2003•Unpublished venueRequires access

Built-in self-test for analog circuits in mixed-signal systems

K. Maggard, Charles E. Stroud

Abstract

A built-in self-test (BIST) approach is presented which is designed to test the analog portion of mixed-signal systems. The BIST approach is evaluated using fault simulation with analog benchmark circuits and is found to consistently provide high fault coverage of all stuck-open and stuck-short faults in the circuit under test.

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Available abstract

Key concepts: Built-in self-test, Analogue electronics, Mixed-signal integrated circuit, Benchmark (surveying), Computer science, Fault (geology), Electronic circuit, SIGNAL (programming language)