Quantitative Scanning Transmission Electron Microscopy for the Measurement of Thicknesses and Volumes of Individual Nanoparticles
Helge Heinrich, Biao Yuan, Haritha Nukala, Bo Yao
Abstract
Helge Heinrich, Biao Yuan, Haritha Nukala, Bo Yao
Abstract
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Key concepts: Materials science, Scanning transmission electron microscopy, Transmission electron microscopy, Energy filtered transmission electron microscopy, Dark field microscopy, Conventional transmission electron microscope, Scattering, High-resolution transmission electron microscopy