On reflection and refraction of x rays by ideal mirrors and thin films

The problem of reflection and refraction of x rays at ideal plane parallel interfaces has been examined based upon the Fresnel equations derived from the classical electromagnetic theory and it has been shown to be identical to the inhomogeneous wave model of Mahan. Furthermore, it is also shown that the reflection coefficient for a thin film in the limit of a monolayer of atoms, large angle of incidence θ, and sin θ/λ≪10 nm−1 is identical to the crystal diffraction model.