2010•IEEJ Transactions on Electrical and Electronic EngineeringRequires access

Vacuum Packaging Technology for Uncooled Infrared Sensor

Masafumi Kimata, Takayuki Tokuda, Akinobu Tsuchinaga, Takeshi Matsumura, Hideyuki Abe, Naotaka Tokashiki

Open publisher page 7 citations

Abstract

Abstract We developed vacuum packaging equipment and low‐cost vacuum packaging technology for the mass production of uncooled infrared focal plane arrays (IRFPAs). The equipment consists of two chambers with identical construction. Two‐chamber architecture provides flexibility in the vacuum packaging process, so we can bake the components and achieve getter activation by heating, stem/cap soldering, and cap/window soldering in a series under high‐vacuum conditions. Heaters and component‐holding jigs are designed to assure rapid and uniform heating to 500°C. The batch size is 27 if we choose a 15‐mm diameter TO8 package and can be increased by enlarging the heater area. We also developed a micro‐vacuum gauge to evaluate the vacuum level in encapsulated packages. The operation principle of this vacuum gauge is based on thermal conduction by air molecules. It can be integrated in IRFPA chips since the fabrication process is compatible with that for IRFPAs. We encapsulated the vacuum gauges in TO8 packages with our vacuum packaging equipment, and confirmed that the pressure in fabricated packages is sufficiently low for high‐performance IRFPA operation (≪1 Pa). Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.

About this research paper

What this paper is about

Abstract We developed vacuum packaging equipment and low‐cost vacuum packaging technology for the mass production of uncooled infrared focal plane arrays (IRFPAs). The equipment consists of two chambers with identical construction. Two‐chamber architecture provides flexibility in the vacuum packaging process, so we can bake the components and achieve getter activation by heating, stem/cap soldering, and cap/window soldering in a series under high‐vacuum conditions. Heaters and component‐holding jigs are designed to assure rapid and uniform heating to 500°C. The batch size is 27 if we choose a 15‐mm diameter TO8 package and can be increased by enlarging the heater area. We also developed a micro‐vacuum gauge to evaluate the vacuum level in encapsulated packages. The operation principle of this vacuum gauge is based on thermal conduction by air molecules. It can be integrated in IRFPA chips since the fabrication process is compatible with that for IRFPAs. We encapsulated the vacuum gauges in TO8 packages with our vacuum packaging equipment, and confirmed that the pressure in fabricated packages is sufficiently low for high‐performance IRFPA operation (≪1 Pa). Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.

Why it matters

OpenAlex reports 7 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Abstract We developed vacuum packaging equipment and low‐cost vacuum packaging technology for the mass production of uncooled infrared focal plane arrays (IRFPAs). The equipment consists of two chambers with identical construction. Two‐chamber architecture provides flexibility in the vacuum packaging process, so we can bake the components and achieve getter activation by heating, stem/cap soldering, and cap/window soldering in a series under high‐vacuum conditions. Heaters and component‐holding jigs are designed to assure rapid and uniform heating to 500°C. The batch size is 27 if we choose a 15‐mm diameter TO8 package and can be increased by enlarging the heater area. We also developed a micro‐vacuum gauge to evaluate the vacuum level in encapsulated packages. The operation principle of this vacuum gauge is based on thermal conduction by air molecules. It can be integrated in IRFPA chips since the fabrication process is compatible with that for IRFPAs. We encapsulated the vacuum gauges in TO8 packages with our vacuum packaging equipment, and confirmed that the pressure in fabricated packages is sufficiently low for high‐performance IRFPA operation (≪1 Pa). Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.

Key concepts: Vacuum level, Getter, Vacuum chamber, Ultra-high vacuum, Fabrication, Materials science, Soldering, Packaging engineering

Related papers

Back to paper searchBrowse research topicsOriginal source
Vacuum Packaging Technology for Uncooled Infrared Sensor — Research Paper | ScholarLens