2010•Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)Requires access
Interface degradation of Al heavy wire bonds on power semiconductors during active power cycling measured by the shear test
Jens Goehre, Martin Schneider‐Ramelow, Ute Geisler, Klaus‐Dieter Lang
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Abstract
Art. 5730637