Markus Lentzen, Chun Lin Jia, Knut W. Urban
Abstract
Markus Lentzen, Chun Lin Jia, Knut Urban; Atomic Structure Imaging Using an Aberration-Corrected Transmission Electron Microscope, Microscopy and Microanal
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Markus Lentzen, Chun Lin Jia, Knut Urban; Atomic Structure Imaging Using an Aberration-Corrected Transmission Electron Microscope, Microscopy and Microanal
Key concepts: Scanning transmission electron microscopy, Electron microscope, Conventional transmission electron microscope, Optics, Transmission electron microscopy, Electron tomography, Materials science, Electron