ESD protection for RF/AMS ICs: Design and optimization
X. Wang, He Tang, Litian Lin, Q. Fang, Hui Lin Zhao, Albert Z. Wang, G. Zhang, X. Wang, Yunyan Zhou, Lee Yang, H. Chen
Abstract
X. Wang, He Tang, Litian Lin, Q. Fang, Hui Lin Zhao, Albert Z. Wang, G. Zhang, X. Wang, Yunyan Zhou, Lee Yang, H. Chen
Abstract
This paper reviews key factors to practical ESD protection design for RF and analog/mixed-signal (AMS) ICs, including general challenges emerging, ESD-RFIC interactions, RF ESD design optimization and prediction, RF ESD design characterization, ESD-RFIC co-design technique, etc. Practical design examples are discussed. It means to provide a systematic and practical design flow for whole-chip ESD protection design optimization and prediction for RF/AMS ICs to ensure 1stSi design success.
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This paper reviews key factors to practical ESD protection design for RF and analog/mixed-signal (AMS) ICs, including general challenges emerging, ESD-RFIC interactions, RF ESD design optimization and prediction, RF ESD design characterization, ESD-RFIC co-design technique, etc. Practical design examples are discussed. It means to provide a systematic and practical design flow for whole-chip ESD protection design optimization and prediction for RF/AMS ICs to ensure 1stSi design success.
Key concepts: RFIC, Electrostatic discharge, Integrated circuit design, Radio frequency, Design flow, Engineering, Electronic engineering, Electrical engineering