Optoelectronic 1/f noise of Avalanche Photodiodes (AlInAs/GaInAs/InP) dedicated to photonic instrumentation and telecommunication
Shiraz Ouarets, B. Orsal, M. Lahrichi, M. Achouche
Abstract
Shiraz Ouarets, B. Orsal, M. Lahrichi, M. Achouche
Abstract
We show for the first time, the results concerning low frequency noise (1HZ-10KHz) of Avalanche Photodiodes (APDs) AlInAs/GaInAs/InP manufactured on Indium Phosphide Substrate (InP). 1/f and multiplication noises are increasing as a function of the multiplication coefficient with the same variation in the power. This specific behavior is explained taking into account the physical properties of APDs.
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We show for the first time, the results concerning low frequency noise (1HZ-10KHz) of Avalanche Photodiodes (APDs) AlInAs/GaInAs/InP manufactured on Indium Phosphide Substrate (InP). 1/f and multiplication noises are increasing as a function of the multiplication coefficient with the same variation in the power. This specific behavior is explained taking into account the physical properties of APDs.
Key concepts: Avalanche photodiode, APDS, Indium phosphide, Optoelectronics, Indium gallium arsenide, Materials science, Photodiode, Noise (video)