2002•Unpublished venueRequires access

Compendium of single event failures in power MOSFETs

J.R. Coss, G.M. Swift, Luis E. Selva, J.L. Titus, E. Normand, D.L. Oberg, J.L. Wert

Abstract

This compendium of SEGR and SEB data organizes results from several laboratories comparing failure thresholds for several different manufacturers and technologies. The results of this compendium are aimed at the designer to show the possible variations between manufacturers and processes. The compendium incorporates previously published data with the most recent data obtained from various sources.

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Available abstract

Key concepts: Compendium, Event (particle physics), Computer science, Reliability engineering, Power (physics), Power MOSFET, Engineering, Electrical engineering