2002Electronics LettersRequires access

Investigation of InAs/GaAs quantum-dot infrared photodetector with In 0.5 Ga 0.5 P dark current blocking layer

Lin Jiang, Sheng S. Li, Nien-Tze Yeh, J.‐I. Chyi, Meimei Z. Tidrow

Open publisher page 9 citations

Abstract

A novel InAs/GaAs quantum-dot infrared photodetector with an In0.5Ga0.5P dark current blocking layer for long-wavelength infrared (LWIR) detection has been developed in this work. Very low dark current densities were obtained at Vb=−0.5 V (10−10 A/cm−2) and Vb=+0.5 V (10−11 A/cm−2) at 77K. The normal incident responsivity up to 90 K was observed in this device. The background limited performance (BLIP) detectivity (D*BLIP) was found to be 3.36×109 cm-Hz1/2/W at λp=12.2 µm with a corresponding responsivity of 55 mA/W at Vb=−1.7 V and T=77K.

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What this paper is about

A novel InAs/GaAs quantum-dot infrared photodetector with an In0.5Ga0.5P dark current blocking layer for long-wavelength infrared (LWIR) detection has been developed in this work. Very low dark current densities were obtained at Vb=−0.5 V (10−10 A/cm−2) and Vb=+0.5 V (10−11 A/cm−2) at 77K. The normal incident responsivity up to 90 K was observed in this device. The background limited performance (BLIP) detectivity (D*BLIP) was found to be 3.36×109 cm-Hz1/2/W at λp=12.2 µm with a corresponding responsivity of 55 mA/W at Vb=−1.7 V and T=77K.

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Available abstract

A novel InAs/GaAs quantum-dot infrared photodetector with an In0.5Ga0.5P dark current blocking layer for long-wavelength infrared (LWIR) detection has been developed in this work. Very low dark current densities were obtained at Vb=−0.5 V (10−10 A/cm−2) and Vb=+0.5 V (10−11 A/cm−2) at 77K. The normal incident responsivity up to 90 K was observed in this device. The background limited performance (BLIP) detectivity (D*BLIP) was found to be 3.36×109 cm-Hz1/2/W at λp=12.2 µm with a corresponding responsivity of 55 mA/W at Vb=−1.7 V and T=77K.

Key concepts: Responsivity, Dark current, Photodetector, Quantum dot, Optoelectronics, Infrared, Blocking (statistics), Materials science

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