Practical Neutron Activation Analysis for the Electronic Scientist

Neutron activation analysis is an extremely sensitive analytical method for determining trace impurities in semiconductor materials. Theoretical aspects are discussed, and procedures are outlined. Parameters which determine sensitivity are considered, as well as the techniques whereby they may be varied to increase sensitivity. Tables are included which list elements that can be determined by neutron activation analysis, their half‐lives, and minimum detectable amounts. Also tabulated are elemental matrix materials of electronic interest together with naturally occurring associated impurities which are determined by neutron activation analysis and other methods. These matrices are also ranked according to extent of flux perturbations, degree of self‐activation, and ease of chemical separation.