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Combination of a scanning tunneling microscope with a scanning electron microscope

L. Vázquez, A. Bartolomé, Ricardo Alexandrino Garcia, Álvaro Buendía, Arturo M. Baró

Open publisher page 37 citations

Abstract

We have placed a scanning tunneling microscope (STM) in the sample stage of a scanning electron microscope (SEM). This allows us to focus the tip on a preselected spot for STM operation with a precision of 0.5 μm. We are able to check the state of the sample and the tip during STM operation by simultaneous use of the SEM. We are also able to correlate the images given by both techniques.

About this research paper

What this paper is about

We have placed a scanning tunneling microscope (STM) in the sample stage of a scanning electron microscope (SEM). This allows us to focus the tip on a preselected spot for STM operation with a precision of 0.5 μm. We are able to check the state of the sample and the tip during STM operation by simultaneous use of the SEM. We are also able to correlate the images given by both techniques.

Why it matters

OpenAlex reports 37 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

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Method / approach

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Main findings

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Limitations

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Available abstract

We have placed a scanning tunneling microscope (STM) in the sample stage of a scanning electron microscope (SEM). This allows us to focus the tip on a preselected spot for STM operation with a precision of 0.5 μm. We are able to check the state of the sample and the tip during STM operation by simultaneous use of the SEM. We are also able to correlate the images given by both techniques.

Key concepts: Scanning tunneling microscope, Scanning electron microscope, Microscope, Scanning Hall probe microscope, Conventional transmission electron microscope, Environmental scanning electron microscope, Low-voltage electron microscope, Electrochemical scanning tunneling microscope

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